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John Cantrell with NASA Langley Research Center |
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Date: February 27, 2004
Time: 10:30am
Location: NIA, Rm 404
Speaker: John Cantrell, NASA Langley Research Center
Subject:* "Advanced Ultrasonic Methods for Materials Analysis and Sensor Development"
A detailed understanding of the interactions of ultrasonic waves with material microstructures provides a practicable means to quantitatively assess structure-property relationships. Such understanding establishes a fundamental scientific underpinning for ultrasonics-based sensors development and provides for a unique characterization methodology that enables the development of other sensor concepts and materials. The role of ultrasound in the development of sensors and methods for monitoring and assessing a variety of physical properties, processes, and microstructural features of materials is discussed including dislocation dynamics, precipitate nucleation and growth, hardness, mechanical strength, state of fatigue, and adhesive bond strength. The unique aspects of electron-acoustic microscopy, scanning acoustic microscopy, and ultrasonic atomic force microscopy as analytical microprobes for materials characterization are presented. A new research initiative directed toward the development of nano-scale sensors by design is addressed, as is a spin-off technology on non-invasive ultrasonic histology.
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