Development of Chipless RFID Sensors for Nondestructive Evaluation (NDE) Applications
Speaker: Katelyn (Katie) Brinker, Ph.D. Candidate, Electrical Engineering, Iowa State University
Date: Thursday, June 2, 2022
Time: 10:00 am
Abstract
Critical materials and structures are constantly subjected to fatigue and degradation, and monitoring and maintaining civil, space, and aerospace infrastructure is an ongoing critical issue. As new materials, such as complex multilayer composites, come into wider use, the need to monitor their performance and overall health is also rapidly growing. Consequently, new and innovative nondestructive testing (NDT) methods are needed in order to address this growing issue. Chipless RFID, is a wireless passive sensor technology that has the potential to address this need, but it also comes with its own challenges. This presentation will discuss recent chipless RFID sensing developments for embedded materials characterization, delamination sensing, and pressure sensing applications, and will also provide a discussion of some of the limitations of this technology.
Bio
Katelyn (Katie) Brinker is a Ph.D. Candidate in Electrical Engineering at Iowa State University conducting research at the Center for Nondestructive Evaluation (CNDE). Her work focuses on the development of wireless passive sensors and microwave nondestructive testing techniques. She previously completed her thesis-based Master’s in Electrical Engineering at Missouri S&T and her work has been supported by a NASA Space Technology Research Fellowship (NSTRF/NSTGRO) and Iowa Space Grant Consortium Graduate Fellowship. She has additionally worked as a NASA Pathways Intern at NASA Goddard Space Flight Center and serves on the AdCom of the IEEE Instrumentation and Measurement Society and IEEE Council on RFID.
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Mary Catherine Bunde
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National Institute of Aerospace
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